• Material Characterization

 

Francelab is offering through its worldwide partners a wide range of high technology instruments for Research and Development and Quality Control laboratories in the field of Ceramics, Composites, Electronics & Semiconductors, Geology & Mineralogy, Polymers, Nanotechnology, Metal, Rubber, Textile and Thin Films.

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WEEE/RoHS/ELV

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The worldwide RoHS, WEEE and ELV directives specify strict limits on the inclusion of Lead, Cadmium, Mercury, hexavalent Chromium, poly-brominated biphenyls (PBB) and poly-brominated diphenyl ethers (PBDE) in materials used within consumer electrical goods and automotives.

  • RoHS - Restriction of the use of certain Hazardous Substances in electrical and electronic equipment
  • ELV - End of Life Vehicles.

X-ray fluorescence is the technique of choice for fast, non-destructive screening of manufacturing materials and parts. Analysis times are typically in the order of a few minutes for sensitivity to concentrations below 100 ppm (0.01%).
The XGT systems offer limits of detection as low as 2 ppm (0.0002%). A standard 1.2 mm analysis beam allows even small electrical components and parts to be individually analysed.

XGT-5200WR are specially designed for WEEE/RoHS, ELV and Chinese RoHS for the high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br) and equipped X-ray Microscope Functions.
 

HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, to providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.

In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series.