• Material Characterization

 

Francelab is offering through its worldwide partners a wide range of high technology instruments for Research and Development and Quality Control laboratories in the field of Ceramics, Composites, Electronics & Semiconductors, Geology & Mineralogy, Polymers, Nanotechnology, Metal, Rubber, Textile and Thin Films.

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Glow Discharge (GD)

Pulsed RF GD – OES is the only technique that can provide both surface, depth profile and bulk composition, and with high sensitivity to all elements (including the gaseous elements), for almost all solid materials, including metals, metal alloy coatings, semiconductors, polymer coatings, glass, etc.

It relies on the controlled sputtering of a representative area of the material of interest and the simultaneous detection of the sputtered species. As an analytical technique it nicely complements XPS and SEM.

The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin film characterization and process studies.

The HORIBA Jobin Yvon GD-Profiler HR™ gives the optimum in terms of resolution and number of elements to solve analytical problems even in the most complex matrices.