• Material Characterization

 

Francelab is offering through its worldwide partners a wide range of high technology instruments for Research and Development and Quality Control laboratories in the field of Ceramics, Composites, Electronics & Semiconductors, Geology & Mineralogy, Polymers, Nanotechnology, Metal, Rubber, Textile and Thin Films.

You are here

Plasma Profiling – TOFMS

Principle

PP-TOFMS couples a glow discharge plasma to an ultra-fast Time of Flight Mass Spectrometer and provides chemical analysis of solid materials as a function of depth with high speed, high resolution and high sensitivity.

Key Applications

Dopants profiling
Surface and bulk contaminants identification
Corrosion science and technology
Nanostructures characterization

PP-TOFMS couples a glow discharge plasma to an ultra-fast Time of Flight Mass Spectrometer and provides chemical analysis of solid materials as a function of depth with high speed, high resolution and high sensitivity.

Specifications