• Material Characterization


Francelab is offering through its worldwide partners a wide range of high technology instruments for Research and Development and Quality Control laboratories in the field of Ceramics, Composites, Electronics & Semiconductors, Geology & Mineralogy, Polymers, Nanotechnology, Metal, Rubber, Textile and Thin Films.

Plasma Profiling -TOFMS

PP-TOFMS couples a glow discharge plasma to an ultra-fast Time of Flight Mass Spectrometer and provides chemical analysis of solid materials as a function of depth with high speed, high resolution and high sensitivity.


  • Acquisition rate: 33 kHz to cover elements up to U (a full spectrum every 30 µs)
  • Mass resolving power: 3500 at m/s 208, high resolution 5000 at m/z 208
  • Dynamic range: 107
  • Mass accuracy (m/z error/true m/z): 40 ppm
  • Sensitivity: 103 cps/ppm
  • Depth resolution: nm
  • Both negative and positive ion mode
  • Flexible blanking capability up to 4 ions
  • Easy and horizontal sample mounting


  • Fast and direct analysis: Without any preliminary preparation and UHV chamber
  • All types of materials and coatings
  • Full mass coverage: Offers elemental (from H to U) and molecular information, including isotopic monitoring
  • Unique 3D data
  • High depth resolution: layers as thin as 1 nm can be measured
  • Thin and thick layers: thickness up to 100 µm
  • Semi-quantitative analysis: Minimal matrix effects due to the separation of sputtering and ionization processes