• Material Characterization

 

Francelab is offering through its worldwide partners a wide range of high technology instruments for Research and Development and Quality Control laboratories in the field of Ceramics, Composites, Electronics & Semiconductors, Geology & Mineralogy, Polymers, Nanotechnology, Metal, Rubber, Textile and Thin Films.

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Microscopy - Optical Spectroscopy

Atomic Force Microscopy

The SmartSPM 1000 Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.

Features:

The OmegaScope 1000 is a state-of-the-art turn-key solution that combines confocal NanoRaman/ Fluorescence spectroscopy and ultra resolution multi-range research AFM enabling TERS (Tip Enhanced Raman Scattering) mapping. It is available in both transmission and reflection configurations providing direct top, bottom and side optical access. The flexibility of the OmegaScope platform offers almost endless possibilities in correlation of high spatial resolution Raman and AFM data.

Main features

The CombiScope 1000 Scanning Probe Microscope (SPM) is an advanced research instrument that provides the entry path for researchers in materials science, biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nanoscale structures and near-field optical properties investigation, the CombiScope 1000 is the right solution for you.

Ellipsometer

UVISEL 2 VUV is specially designed for VUV measurement. There is no oxygen absorption with acquisition. It’s a n unique VUV spectral ellipsometer for high accurancy, unique fast measurement, fast vacuum ability, allowing you to change samples quickly, and using low amounts of nitrogen.

Features

The Auto SE is a fast, easy-to-use automatic ellipsometer that provides results and reports in a matter of seconds, making it an ideal instrument for routine thin film measurements.

Features:

The UVISEL spectroscopic phase modulated ellipsometer is a turn-key thin film metrology instrument for in-line measurement of thin film thickness and optical properties.
It features rapid measurement capability with data acquired every 50 ms for powerful control of thin film uniformity across the entire spectral range.

Features

The new UVISEL 2 is the next generation of scanning scientific ellipsometers that delivers the highest level of performance in an innovative, integrated, and fully automated design.

Features

The Smart-SE is an innovative and flexible ellipsometer which provides fast results in either an ex-situ or in-situ configuration.

Features:

  • Simple push button operation
  • Liquid crystal based modulation; no moving optical components
  • CCD-based for fast spectral acquisition-patented vision system
  • Ability to change the angle of incidence
  • In-situ configuration is available
  • Fixed spectral range of 450 nm~1000 nm

Raman AFM

Fully integrated system based on AIST-NT SmartSPM state-of-the-art scanning probe microscope and HORIBA XploRA compact and fully automated micro-spectrometer​

Fully integrated system based on AIST-NT SmartSPM

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