• Laboratory Equipment


Francelab is offering through its worldwide partners a wide range of high technology instruments and products for Research and Development and Quality Control laboratories in the field of Agriculture, Biology, Biochemistry, Biophysics, Biotechnology, Clinical, Chemistry, Cosmetic, Environment, Food and Beverage, Microbiology and Pharmaceutical.


Spectroscopic ellipsometry is a non-destructive and non-contact optical technique which is based on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Ellipsometry utilizes a model-based approach to determine thin film thickness, optical properties, and more.

Information obtained from ellipsometry:

  • Film thickness from a few Angstroms to tens of microns
  • Optical constants (n,k)
  • Material properties: compound alloy composition, porosity, crystallinity, anisotropy, optical bandgap

Technical Features:

  • Non-destructive and non-contact
  • Very sensitive, especially to ultra-thin films (<10 nm)In-situ real-time monitoring of thin film deposition oretching by rapid kinetic measurements
  • No sample preparation

Key Applications

  • Biotechnology
  • Displays
  • Nanotechnology
  • Optical Coatings
  • Optoelectronics 
  • Semiconductors

The new UVISEL 2 is the next generation of scanning scientific ellipsometers that delivers the highest level of performance in an innovative, integrated, and fully automated design.


The UVISEL spectroscopic phase modulated ellipsometer is a turn-key thin film metrology instrument for in-line measurement of thin film thickness and optical properties.

UVISEL 2 VUV is specially designed for VUV measurement. There is no oxygen absorption with acquisition. It’s a n unique VUV spectral ellipsometer for high accurancy, unique fast measurement, fast vacuum ability, allowing you to change samples quickly, and using low amounts of nitrogen.

The Auto SE is a fast, easy-to-use automatic ellipsometer that provides results and reports in a matter of seconds, making it an ideal instrument for routine thin film measurements.


The Smart-SE is an innovative and flexible ellipsometer which provides fast results in either an ex-situ or in-situ configuration.